You need to sign in or sign up before continuing.

J. Antonio Quiroga

1 book

Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications by Moises Padilla, J. Antonio Quiroga, Manuel Servin

Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications

Moises Padilla, J. Antonio Quiroga, Manuel Servin

344 pages • hardcover

nonfiction art technology medium-paced