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Richard Beanland, Peter J. Goodhew, John Humphreys
264 pages • missing pub info (editions)
ISBN/UID: 9781420017250
Format: Hardcover
Language: English
Publisher: Not specified
Publication date: Not specified
Description
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microsco...
Community Reviews
Content Warnings
—
Richard Beanland, Peter J. Goodhew, John Humphreys
264 pages • missing pub info (editions)
ISBN/UID: 9781420017250
Format: Hardcover
Language: English
Publisher: Not specified
Publication date: Not specified
Description
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microsco...
Community Reviews
Content Warnings